Ultra-large Stroke Type with Maximum Magnification Module NEXIV VMR-10080 Z120X
The model achieves ultrahigh magnification measurements with a long 1000 x 800mm stage stroke. Ideal for measuring minute linewidths of large-size display panels.
Applications
LCD glass substrates (pattern measurements)
Organic EL glass substrates (pattern measurements)
- Automatic measurements of small parts by placing multiple pieces together on the stage
- Laser AF achieves high-accuracy measurements of bump heights
- Laser AF also enables measurements of height gaps and warping in workpieces
- Search function enables measurements of lands and holes of PCBs
- Search function also provides accurate measurements even when workpieces are not located properly on the stage
- Variety of illumination choices facilitate accurate edge detection even for vague geometries
- High-speed stage and high-speed image processing provide high throughput
