Industrial

SMZ series can be used at on-site inspection or for manipulation of a sample thanks to their stereoscopic image, long working distance and wide field of view. Various models are available for many applications and purposes.

AZ series offers the combined advantages of a stereoscopic microscope with a wide field of view and a long working distance and an industrial microscope with high-resolution images and various observation methods.

ShuttlePix head can be used as a handheld zoom microscope or attached to motorized focusing stand. It offers to capture high quality images of objects of almost all any size in any location imaginable.

The Digital Sight camera system allows you to freely combine camera headswith stand-alone or PC-based contorol units.

Nikon offers the total software solution that covers image capture, archiving, and analysis.

X-ray and CT Inspection offer non-destructive methods to view the internal structures of electronic or industrial parts for defect inspection and measurements.

This equipment is used for high-precision inspections and measurements in the semiconductor manufacturing process.

Profile Projector technology designed to display accurate magnification of workpiece for comparision and precision measurements with data processing.

Autocollimator instruments with brightfield and darkield models for simultaneous measurements on two axes and for easy alignment and measurements.

NEXIV series designed for high-speed and accurate measurement of small to large workpieces using optical, laser, and touch probe sensors.

3D Metrology solutions enabling the Digital Inspection Process (DIP) with accurate point clouds for today's digital designs in the manufacturing process.

Metrology Assisted Production instrumentation for succesful deployment of metrology-driven manufacturing and production by providing accurate geometrical data.

Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to suit a wide range of measurement applications.