XC65D(-LS) Cross Scanner
Full 3D capture of complex features and surfaces
Incorporating 3 lasers in a cross pattern, the XC65D captures all full 3D details of features, edges, pockets, ribs and freeform surfaces in a single scan. By digitizing complex features from 3 sides, the Cross Scanner acquires the complete 3D geometry of the features, driving the accurate extraction of positions and dimensions.
The Cross Scanner's entirely digital operation boosts scanning frequency and drives intelligent laser intensity adaptation to scan any surface without user interaction.
Features
- Cross-pattern of 3 lasers to obtain full 3D view in one scan
- Drastically reduces time-consuming probe head indexing and eliminates C-axis
- Fast digital scanner operation including high-speed CMOS camera technology
- XC65D-LS longer stand-off variant for optimum capture of deep pockets and slots
- Accuracy 9µm (XC65D) and 12µm (XC65D-LS)
XC65Dx | XC65Dx-LS | |
---|---|---|
Field of View | 3x65mm | |
Probing error (MPEp)1 | 12μm | 15μm |
Data acquisition (approx. pts/sec) | 75,000 | |
Stand-off | 75mm | 170mm |
Enhanced scanner performance (ESP3) |
√ |
Applications
- Inspection sheet metal features (slots, holes, etc.)
- Inspection of castings and complex surfaces
- Feature inspection
- Gap & flush inspection
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BENEFITS OF CMM-BASED LASER SCANNING
- Simplified measurement and processing setup
- Teach scan paths or indicate scan area on CAD
- Import feature properties and GD&T information directly from CAD
- Macro functionality for fully automated scanning and inspection
- Reduced measurement time
- Reduction of probe head movements
- XC65D(-LS) scanner captures full feature information in a single movement
- Unique capability to measure freeform and fragile surfaces
- Detailed description of freeform surface in short time interval
- Non-contact measurement eliminates the need to touch fragile and delicate parts
- Powerful reporting with colored CAD deviation maps
- Input for reverse engineering, rapid prototyping, finite element calculations, and digital archiving
- Simplified measurement and processing setup