Analysis & Measurement
With almost 100 years working in the field of optics, Nikon has acquired and developed industry leading metrology capabilities that allow for complete characterization of key optical and material properties. Our key capabilities include internal material characteristics from refractive index homogeneity and birefringence to chemical and physical property evaluation. We also provide high-resolution reflectance/transmittance measurements as well as a variety of other services to meet our customers' unique requirements.
Please contact our sales office for a complete list of measurement services available.
Transmittance
Characteristics
- Ability to measure a wide range of wavelengths (120 nm to 6000 nm)
- Double Beam (~ 3300 nm) Spectrophotometer optical system to reduce measurement variations using our proprietary adjustment techniques
- Nikon's precision cleaning processes eliminate the influence of organic contamination, resulting in high-accuracy transmittance measurements
- Available measurements include fixed-point absolute measurement, wavelength scanning measurement and mapping measurement
Wavelength reproducibility
±0.025 nm@UV~VIS (190 ~ 900 nm)
±0.1 nm@NIR (900 ~ 6000 nm)
Measurement samples:
Transparent glass, crystal, resin, liquid
Measurement example
Internal transmittance chart
Transmittance map on sample
Birefringence
Characteristics
- High-accuracy in-plane distribution of birefringence measurements
- Ability to determine the direction of the fast axis
Repeatability
≦ 0.1 nm
Measurement samples:
Transparent glass, crystal, resin
Measurement example
Birefringence map (birefringence amount)
(birefringence amount and fast axis direction)
Refractive index homogeneity
Characteristics
- Measurement of large glass material of Φ650 mm using our proprietary technologies is also available
- Simultaneous front and back surface measurement of refractive index homogeneity and surface shape using the FT-PSI method
- High-accuracy measurement can be achieved by optimizing the measurement surface of the sample with Nikon's precision polishing process
RMS reproducibility
< 0.1 nm
Measurement samples
Transparent glass, crystal
Measurement example
Homogeneity (3D map)
Homogeneity (Cross-section map)
Analysis and Measurement Services
Item | Wavelength range, condition, usage, equipment |
---|---|
Refractive index | Standard wavelength: C, d, F, g |
Wavelength: 185 ~ 1013 nm | |
Temperature coefficients of refractive index | Wavelength: i, g, F, F', e, d, C', C, r Temperature: -70 ~ 90 °C |
Refractive index homogeneity | Wavelength: 193 nm, 633 nm |
Transmittance | Wavelength: 120 ~ 6000 nm |
i-line solarization | Super-high-pressure mercury lamp |
Laser durability | ArF excimer laser |
Reflectance | Wavelength: 240 ~ 2600 nm |
Birefringence | Crossed Nicols method |
Standard measurement (accuracy: 1 nm/cm) | |
Precise measurement (accuracy: 0.1 nm/cm) | |
Birefringence distribution (wavelength: 157 nm, 193 nm, 248 nm, 633 nm) | |
Photoelastic constant | Wavelength: 157 nm, 193 nm, 248 nm, 633 nm |
Density | JOGIS 05 |
Fluorescence | Wavelength: 220 ~ 730 nm |
Crystal orientation | Calcium fluoride, Quartz, Sapphire, Magnesium fluoride, etc. |
Internal quality | JOGIS 11, 12, 13 |
Raman spectroscopy | Hydrogen concentration, OH concentration, Fictive temperature (silica glass evaluation) |
Focal length | Standard wavelength: C, d, e |
Photomicroscopy | Light microscope (maximum 50 magnifications) |
Thermal properties | Linear expansion coefficient (room temperature ~ 1500 °C) |
Transformation temperature, Yield point | |
Thermogravimetric/Differential thermal analysis (room temperature ~ 1450 °C) |
|
DSC (room temperature ~ 1500 °C) | |
Mechanical properties | Young's modulus, Shear modulus, Poisson's ratio |
Knoop hardness, Vickers hardness | |
Abrasion (JOGIS 10) | |
Chemical properties | Climate resistance, Water resistance, Acid resistance, Alkali resistance |
- *Samples may need to be processed depending on measurements. Please contact us to learn more about prices and lead times.
- *Please contact us about other measurement conditions and analysis of results.
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Please see our brochure for more details